Photo-Induced Emission Analysis to Identify Surface Contaminants

Photo-Induced Emission Analysis to Identify Surface Contaminants (LAR-TOPS-236)
Innovative instrument to identify, quantify, and characterize contamination, even on irregularly shaped surfaces
A novel instrument to measure low levels of contamination on curved or irregular shaped surfaces. The instrument offers multiple unique capabilities such as the ability to identify and quantify contamination and analyze multiple surfaces simultaneously. This information provides an analysis of surface cleanliness needed for more reliable adhesive bonding in applications such as light weight aircraft.

The Technology
This instrument directs UV radiation onto a surface, which produces a small electric current. The instrument then measures that current as it changes over a small time interval. By analyzing the current, the level of contamination on the surface and the identification of the contaminant species can be determined.
aircraft manufacturing This NASA technology could be used by semiconductor manufacturers.Image credit: Pixabay/mikadago
  • Real-time identification and quantification of contaminants, even on irregularly shaped surfaces
  • Rapid analysis of surface cleanliness
  • Measures multiple surfaces simultaneously

  • Manufacturing processes where two surfaces are adhesively bonded
  • Semiconductor manufacturing
  • Aircraft manufacturing
  • Automotive manufacturing
Technology Details

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