Sub-Pixel Spatial Resolution Interferometry (SSRI)
optics
Sub-Pixel Spatial Resolution Interferometry (SSRI) (MFS-TOPS-110)
Interlaced Stitching Technique for Increased Spatial Resolution
Overview
Innovators at NASA's Marshall Space Flight Center, in conjunction with the Center for Applied Optics at the University of Alabama in Huntsville, have developed a system that increases the spatial resolution of interferometric measurements of optical surfaces beyond the fundamental Nyquist Limit of the interferometer's imaging system/detector. This Sub-Pixel Spatial Resolution Interferometry (SSRI) system enables optical fabricators to accurately qualify surface features of spatial frequencies that could not be accurately resolved using standard interferometers. Current trends in optical design are producing new types of specifications, requiring distinct spatial frequency bands and calling for larger aperture optics. However, the ability to characterize these features over the full aperture necessitates improvements. NASA's SSRI system meets this need by increasing the spatial resolution of full aperture interferometric measurements using a technique which incorporates interlaced stitching of low-resolution measurements taken at sub-pixel lateral shifts to enhance spatial resolution.
The Technology
The Sub-Pixel Spatial Resolution Interferometry (SSRI) system increases the spatial resolution of the interferometric measurements by performing multiple measurements of an optical surface with sub-pixel shifts between a charged coupled device (CCD) detector and the optic under test between measurements. The measurements are then combined to create a single measurement with higher spatial resolution. The measurements are combined using a stitching algorithm. This method relieves the spatial resolution constraint defined by the pixel size and spacing. It is assumed that the optical system has been designed to allow the higher spatial frequency features to pass. The SSRI system enables the ability to obtain interferometric measurements of precision optics which have a spatial resolution higher than that defined by the interferometers fundamental limit. This new technique will enable precision optics to be accurately qualified against the specifications and allow fabricators to deterministically correct the higher spatial frequency errors. The SSRI system can be integrated, with slight modifications, into existing commercially available interferometers and interferometric profilers to increase the obtainable spatial resolution.


Benefits
- Improved spatial resolution: the SSRI system enables the ability to obtain interferometric measurements of precision optics which have a spatial resolution higher than that defined by the interferometers fundamental limit
- Ease of integration: implementation requires only slight modification to commercially available interferometers
- Accurate qualification of precision optics: the SSRI system can accurately qualify the surface error of high precision optics, which allows fabricators to deterministically correct the higher spatial frequency errors
Applications
- Aerospace and Aviation: aircraft-mounted and space-based interferometers
- Electronics: printed circuit board (PCB) and microprocessor fabrication
- Military: production of precision military optics
- Optics: integration into interferometers for increased spatial resolution
- Semiconductors: photolithography
Technology Details
optics
MFS-TOPS-110
MFS-32323-1
Introduction to the Sub-pixel Spatial Resolution Interferometry Process, James T. Mooney & Phil H. Stahl, January 1, 2005,https://ntrs.nasa.gov/citations/20050182028
Sub-pixel phase-measuring interferometry with interlace stitching, James T. Mooney & Phil H. Stahl, January 1, 2005, https://ntrs.nasa.gov/citations/20050215544
Sub-pixel Spatial Resolution Micro-roughness Measurements with Interlaced Stitching, James T. Mooney & Phil H. Stahl, January 1, 2005, https://ntrs.nasa.gov/citations/20050215492
Sub-pixel phase-measuring interferometry with interlace stitching, James T. Mooney & Phil H. Stahl, January 1, 2005, https://ntrs.nasa.gov/citations/20050215544
Sub-pixel Spatial Resolution Micro-roughness Measurements with Interlaced Stitching, James T. Mooney & Phil H. Stahl, January 1, 2005, https://ntrs.nasa.gov/citations/20050215492