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The electromagnetic properties of the material are engineered by optimizing its complex dielectric function through the volume filling fraction of its components. A low-index polymeric binder, such as thermal polymers and epoxies, serves as the host medium to minimize reflectance in the conductively loaded dielectric media. To ensure thermal compatibility with metal substrates in cryogenic environments, dielectric powders are incorporated to match thermal expansion. Additionally, alumina frit compensates for thermal contraction at cryogenic temperatures, while non-magnetic conductive particles such as bronze, carbon allotropes, and degenerately doped silicon help tailor the material’s dielectric response. To enhance performance, small-particle scatterers reduce heat capacity and limit resonant dispersion, while dirty alloys stabilize resistance under conductive loading. The formulation incorporates reststrahlen materials and supports applications across the microwave to terahertz range, making it suitable for baffles, Lyot stops, and optical terminations, or as a primer for enhancing near-infrared and visible black paints. This high-emissivity, non-magnetic coating is designed for microwave to far-infrared instrumentation in space and cryogenic systems. It also benefits industries producing absorptive epoxies, EMI/EMC shielding, and quantum sensing components. It has reached Technology Readiness Level (TRL) 5 (component validation in relevant environment) and is now available for patent licensing.

This NASA technology transforms a conventional infrared (IR) imaging system into a multi-wavelength imaging pyrometer using a tunable optical filter. The actively tunable optical filter is based on an exotic phase-change material (PCM) which exhibits a large reversible refractive index shift through an applied energetic stimulus. This change is non-volatile, and no additional energy is required to maintain its state once set. The filter is placed between the scene and the imaging sensor and switched between user selected center-wavelengths to create a series of single-wavelength, monochromatic, two-dimensional images. At the pixel level, the intensity values of these monochromatic images represent the wavelength-dependent, blackbody energy emitted by the object due to its temperature. Ratioing the measured spectral irradiance for each wavelength yields emissivity-independent temperature data at each pixel. The filter’s Center Wavelength (CWL) and Full Width Half Maximum (FWHM), which are related to the quality factor (Q) of the filter, are actively tunable on the order of nanoseconds-microseconds (GHz-MHz). This behavior is electronically controlled and can be operated time-sequentially (on a nanosecond time scale) in the control electronics, a capability not possible with conventional optical filtering technologies.

NASA’s PLED thermal inspection system consists of an array of high- powered LED chips configured to deliver controlled pulses of visible light. The system includes 8 LED chip arrays, mounted on an aluminum heat sink and housed in a hood configuration. The inspection hood is specially designed with filters to prevent internal reflections. The LEDs are powered by regulated power supplies and controlled via a computer interface that synchronizes heat pulses with an infrared camera. An acrylic filter is placed over the LEDs to block residual infrared radiation, ensuring that only visible light reaches the target surface. The system’s infrared camera, operating in the mid-wave infrared (MWIR) range does not detect the visible light and captures the transient thermal response of the material, allowing for precise defect detection. By eliminating the need for high-intensity broadband infrared sources, the PLED system provides a cleaner and more accurate thermal response, particularly for unpainted metals and additively manufactured (AM) components. Performance validation of the PLED system has demonstrated significant advantages over traditional flash thermography. In tests on aluminum samples with material loss and AM Ti-6Al-4V metal specimens, the PLED system successfully detected defects with superior contrast and no heat source reflections. Principal Component Analysis (PCA) applied to PLED inspection data revealed clearer defect indications compared to flash-based methods, which introduced unwanted artifacts due to transient reflections. Additionally, the PLED system enabled quantitative thermal diffusivity measurements, offering a new approach to single-sided material characterization. NASA's PLED thermal inspection technology is available for patent licensing. Potential applications include corrosion detection in aerospace components, quality control of AM metal parts, structural health monitoring of industrial materials, and more.