Virtual Events

Discover how NASA Langley Research Center's Pulsed Light Emitting Diode (PLED) Thermal Inspection technology is transforming non-destructive testing. By eliminating infrared reflect interference, PLED delivers more accurate defect detection on low-emissivity surfaces, ideal for aerospace, automotive, and additive manufacturing applications. Join our webinar to learn how this solution enhances precision, cost-efficiency, and safety.

Join us for an in-depth look at a cutting-edge innovation developed at NASA's Johnson Space Center that enhances the precision and efficiency of strain measurement in complex materials. Ideal for researchers, engineers, and anyone working with advanced materials, this webinar will explore how this method improves upon standard monochrome DIC, offering faster and more accurate strain analysis for research and industrial applications.