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Below an MPL’s minimum overlap range, the return signals are not completely in the instrument’s field of view, so the receiver only captures a portion of the backscatter laser pulse. MPL overlap ranges vary, but is usually between 4-8 km, encompassing the lower atmosphere where most aerosols reside. Commonly, correction entails recording horizontal profiles that require a ~10 km clear line-of-sight and homogenous atmospheric conditions, limiting the solution’s practicality. In contrast, NASA’s WFR device corrects for the overlap using a second receiver co-aligned with the MPL that captures the same backscattered laser pulses as the MPL receiver, but with a ~20x wider FOV that enables a much shorter overlap range from ~6 km down to 250 m. Thus, the combination of the WFR and MPL can capture accurate signals from near surface to the stratosphere. The WFR utilizes the same detector as the MPL, enabling it to connect to the MPL data system for synced data acquisition. By eliminating the need for homogeneous horizontal measurements to determine the MPL overlap function, overlap corrections are more easily and more frequently obtained. Further, the WFR mount base was designed to easily integrate with MPLs. NASA originally developed this device to improve accuracy of MPLs in the MPLNET, ensuring data collected are both accurate and reliable, thereby enhancing our understanding of atmospheric processes and contributing to more informed climate research and environmental modeling. The technology’s operational ease, flexibility, and cost savings are relevant to a wide range of scientific, environmental, and industrial applications. Companies that manufacture and sell MPLs may wish to offer this advanced calibration device as a product to enhance accuracy of MPL-based measurements. This NASA technology is at TRL 8 (Actual system completed and "flight qualified" through test and demonstration.) and is available for patent licensing.

NASA's new calibration system is a proprietary method to quickly design and make predictable and repeatable gap-and-overlap defects when employing AFP. The system creates defects within the course of layup with known sizes, geometries, and locations. Using this defect-creation technique, one can now accurately quantify the ability to detect defects on inspection systems, perform accurate risk assessments, and calibrate in-situ inspection equipment to specific materials. The equipment that makes the defects can be efficiently and inexpensively 3D printed. This technique is currently being used to successfully calibrate NASA's in situ inspection system for their AFP equipment. AFP is experiencing increasing adoption in aerospace, automotive, and other industries that leverage large-scale advanced composite components. NASA's new AFP calibration system could be very useful to companies that develop and manufacture AFP machines or AFP machine inspection equipment to improve the quality of their products in a provable manner. Furthermore, users of AFP machines may find value in the tool for creating their own calibration standards.