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NASAs software technology uses an Image Quality Indicator (IQI)-based model that can predict whether cracks of a certain size can be detected, as well as a model that can provide appropriate conditions to optimize x-ray crack detection setup. Because this modeling software can predict minimum crack sizes that can be detected by a particular X-ray radiography testing setup, users can test various setups until the desired crack detection capabilities are achieved (predicted) by the modeling system. These flaw size parameter models use a set of measured inputs, including thickness sensitivity, detector modulation transfer function, detector signal response function, and other setup geometry parameters, to predict the minimum crack sizes detectable by the testing setup and X-ray angle limits for detecting such flaws. Current X-ray methods provide adequate control for detection of volumetric flaws but do not provide a high probability of detection (POD), and crack detection sensitivity cannot be verified for reliable detection. This results in reduced confidence in terms of crack detection. Given that these cracks, if undetected, can cause catastrophic failure in various systems (e.g., pressure vessels, etc.), verifying that X-ray radiography systems used for NDE can detect such cracks is of the utmost importance in many applications.

NASA’s PLED thermal inspection system consists of an array of high- powered LED chips configured to deliver controlled pulses of visible light. The system includes 8 LED chip arrays, mounted on an aluminum heat sink and housed in a hood configuration. The inspection hood is specially designed with filters to prevent internal reflections. The LEDs are powered by regulated power supplies and controlled via a computer interface that synchronizes heat pulses with an infrared camera. An acrylic filter is placed over the LEDs to block residual infrared radiation, ensuring that only visible light reaches the target surface. The system’s infrared camera, operating in the mid-wave infrared (MWIR) range does not detect the visible light and captures the transient thermal response of the material, allowing for precise defect detection. By eliminating the need for high-intensity broadband infrared sources, the PLED system provides a cleaner and more accurate thermal response, particularly for unpainted metals and additively manufactured (AM) components. Performance validation of the PLED system has demonstrated significant advantages over traditional flash thermography. In tests on aluminum samples with material loss and AM Ti-6Al-4V metal specimens, the PLED system successfully detected defects with superior contrast and no heat source reflections. Principal Component Analysis (PCA) applied to PLED inspection data revealed clearer defect indications compared to flash-based methods, which introduced unwanted artifacts due to transient reflections. Additionally, the PLED system enabled quantitative thermal diffusivity measurements, offering a new approach to single-sided material characterization. NASA's PLED thermal inspection technology is available for patent licensing. Potential applications include corrosion detection in aerospace components, quality control of AM metal parts, structural health monitoring of industrial materials, and more.