Single Crystal SiGe/Sapphire Epitaxy

The Molten Target Sputtering (MTS) method can increase the kinetic energy, the energy latency, and the flux density of sputtered atoms by combining the benefits of both magnetron sputtering and evaporation systems. It does this by a clever, but simple mechanical modification to the magnetron sputtering gun. For the MTS method, only a 1~2mm (depth and width) ring-shape groove is cut between the magnets in order to keep a gap between the copper plate and the sputtering target, as below. This effectively increases the efficiency of magnetron based sputtering machines. The ring enhances the magnetic field intensity and increases the temperature of the target material. A key difference in design between a conventional sputtering gun and the MTS gun seems very minor, but the ring-shape groove between magnets allows for trapping a portion of magnetic field within the groove. A trapped field creates an additive force to expel the ionized particles (atoms and molecules combined within plasma) by increasing their kinetic energy. The ring groove also serves to increase the target material temperature because the conduction passage of thermal energy to the water-cooled copper sink is interrupted by the empty space of a ring groove below the target. Accordingly, the target surface material is heated to a higher temperature, which in turn increases the flux density by more easily liberating the atoms from the target.

This process utilizes an electron beam flood gun to irradiate the sapphire surface as a means of raising the surface temperature. As the electrons collide with the top layers of surface atoms, the substrate absorbs much of the energy through thermalization losses from the electrons. Subsequently, the surface temperature rises and this modifies the atomic surface structure into a form conducive to single crystal SiGe epitaxy. Moreover, while tested on sapphire, this method applies to any other wafer material, providing a broad new means of changing surface temperature and atomic structure independently of the substrate heater.

Several of the patented methods included in this suite of technologies enable super-hetero-epitaxy of rhombohedral/cubic compound semiconductors on specially oriented trigonal (e.g. sapphire) or hexagonal (e.g. quartz) crystal wafer substrates. This includes alignment of the growth crystal lattice with the underlying substrate lattice to minimize misfit strain-induced dislocation defects in the growing crystal. Thus thicker, defect-free crystal layers can be made. Rhombohedral/Cubic crystal twin defects which is 60 degree rotated on [111] orientation in a rhombohedral/cubic SiGe layer structure can be reduced to well less than 1% by volume, essentially providing a defect-free semiconductor material. Alternately, engineered lattice structures with a high degree of twinning can provide SiGe with improved thermoelectric properties due to the phonon scattering that inhibits thermal conduction without compromising electrical conductivity. Additional patented technologies in this suite provide for physical vapor deposition (PVD) growth methods utilizing molten sputtering targets and thermal control of heated substrates, including electron beam heating, in order to give the atoms in the sputtered vapor or on the substrate surface the energy needed for the desired crystal growth. The remaining patented technologies enable x-ray diffraction methods for detecting and mapping crystal twin defects across the entire as-grown semiconductor layer. These defects are critical to the performance of any semiconductor device manufactured from such compound semiconductor materials.

Single Crystal SiGe semiconductors are viable via numerous advances patented by NASA. This includes the addition of a 1-2mm ring groove in the magnetron magnets which increases sputtering energy at 500C vs 800C, enabling thicker, faster deposition with better surface finish and consistent quality without heat soaking. The lack of thermal gradient removes inconsistencies in the product. SiGe can also utilize the CMOS manufacturing technique for additional cost savings and waste reduction. Further decreases to time investment for single crystal SiGe is made possible via reduced thermal load and soak temperatures, growing SiGe semiconductors on, conveniently, less expensive sapphire substrates. Crystal lattice matched growing methods to the sapphire substrate ensure defect-free SiGe production without interfacial dislocations. A graded indexed SiGe layer can be added to wafers grown in this lattice matched method, permitting thicker semiconductor growth without abrupt changes in strain build-up, carrier potential barrier, index of refraction change and bandgap at the interface. These advances provide improved semiconductor performance and quality with fewer defects in fabrication. The crystal alignment enables X-Ray diffraction identification of any defect location and density. It is also possible to also grow a Gallium Nitride or Indium Gallium Nitride layer on the opposite side of the Sapphire wafer, useful for solar capable LED display. A type II band-gap alignment of SiGe would result in highly efficient solar cells – attaining 30% to 40% energy conversion efficiency. In addition to SiGe, the patented technology also covers these methodologies on tin-based or carbon-based semiconductors.

III-nitride devices are commonly made on sapphire substrates today for various commercial electronic and optoelectronic applications. Thus, this innovation relates directly to the combination of devices on opposite sides of the sapphire substrate. One possible device combination is to have LEDs one side and solar cells on the other, such as for displays.