N Channel JFET Based Digital Logic Gate Structure

NASA Glenn's durable, extreme-temperature, integrated circuit chips begin with the replacement of conventional silicon IC transistors with n-channel SiC junction field effect transistors (JFET) and resistors that can reliably function above 500°C. JFETs with the necessary high-temperature stability and electrical gain are fabricated from commercial 4H-SiC wafers with epilayers using dry etching and a self-aligned n-type ion implantation. An innovative circuit approach creates digital logic gates from these normally-on n-channel JFETs and resistors. Using two levels of 500°C durable metal to interconnect numerous SiC gates, complex circuits enabling a variety of control, operation and sensing functions for intelligent systems in harsh environments can be implemented in physically small chips. The challenge of getting electrical signals to and from the chip in a harsh environment is overcome by the use of the iridium interfacial stack (IrIS) that acts simultaneously as a bond metal and diffusion barrier, and can be used on an ohmic contact to the SiC. Combined with Glenn-developed high-temperature durable ceramic chip packaging and harsh environment sensor technology, this revolutionary durable integrated circuit technology is game changing for harsh-environment applications of all types.

In conjunction with academia and industry, NASA's Glenn Research Center has developed a range of microelectromechanical systems (MEMS)-based and SiC-based microsensor technologies that are well-suited for many applications. The suite of technologies includes (1) hydrogen and leak detection sensors; (2) emissions sensor arrays; (3) SiC high- temperature pressure sensors; and (4) high-temperature contact pads for wire bond connections. Currently used to protect astronauts on the International Space Station, the hydrogen and leak detection sensors have many Earth-based applications as well. They can function as a single-sensor unit or as part of a complete smart sensor system that includes multiple sensors, signal conditioning, power, and telemetry. The system can comprise sensors for hydrocarbons, oxygen, temperature, and pressure. The emissions sensor array features a gas-sensing structure that detects various combustion emission species (carbon monoxide, carbon dioxide, oxygen, hydrocarbons, and nitrogen oxides) over a wide range of concentrations. In addition, the emissions sensor array remains highly sensitive and stable while providing gas detection at temperatures ranging from 450 to 600°C, as does the SiC high-temperature pressure sensor. These new sensors provide a combination of responsiveness and durability that offers great value for a wide range of applications and industries.

In conjunction with academia and industry, NASA's Glenn Research Center has developed a range of microelectromechanical systems (MEMS)-based and Silicon Carbide (SiC)-based microsensor technologies that are well-suited for many applications. The suite of technologies includes hydrogen and hydrocarbon leak detection sensors; emissions sensor arrays; and high-temperature contact pads for wire bond connections. Currently used to protect astronauts on the International Space Station, the hydrogen and leak detection sensors have many Earth-based applications as well. They can function as a single-sensor unit or as part of a complete smart sensor system that includes multiple sensors, signal conditioning, power, and telemetry. The system can comprise sensors for hydrogen, hydrocarbons, oxygen, temperature, and pressure. The emissions sensor array features a gas-sensing structure that detects various combustion emission species (carbon monoxide, carbon dioxide, oxygen, hydrocarbons, and nitrogen oxides) over a wide range of concentrations. In addition, the emissions sensor array remains highly sensitive and stable while providing gas detection at temperatures ranging from 450 to 600°C. These new sensors provide a combination of responsiveness and durability that offers great value for a wide range of applications and industries.

The technology is part of a new generation of NASA Glenn SiC integrated circuits with unprecedented durability in the field of high-temperature electronics. For robust operational amplifiers based on SiC Junction Field Effect Transistors (JFETs), this novel compensation method mitigates issues with threshold voltage variations that are an effect of die location on the wafer. Modern high-temperature op amps on the market fall short due to temperature limits (only 225°C for silicon-based devices). Previously, researchers noted that multiple op amps on a single SiC wafer had different amplification properties due to different threshold voltages that varied spatially as much as 18&#37 depending on the circuit's distance from the SiC wafer center. While 18&#37 is okay for some applications, other important system applications demand better precision. By applying this technology to the amplifier circuit design process, the op amp will provide the same signal gain no matter its position on the wafer. The compensation approach enables practical signal conditioning that works from 25°C up to 500°C.

To avoid catastrophic failure, traditional electrical ohmic contacts must be placed at some distance from the optimal position (especially for sensors) in high-temperature environments. In addition, conventional metallization techniques incur significant production costs because they require multiple process steps of successive depositions, photolithography, and etchings to deposit the desired ohmic contact material. Glenn's novel production method both produces ohmic contacts that can withstand higher temperatures than ever before (up to 600°C), and permits universal and simultaneous ohmic contacts on n- and p-type surfaces. This makes fabrication much less time-consuming and expensive while also increasing yield. This innovative approach uses a single alloy conductor to form simultaneous ohmic contacts to n- and p-type 4H-SiC semiconductor. The single alloy conductor also forms an effective diffusion barrier against gold and oxygen at temperatures as high as 800°C. Glenn's extraordinary method enables a faster and less costly means of producing SiC-based sensors and other devices that provide quicker response times and more accurate readings for numerous applications, from jet engines to down-hole drilling, and from automotive engines to space exploration.