X-Ray Diffraction Method to Detect Defects in Cubic Semiconductor (100) Wafers

NASAs software technology uses an Image Quality Indicator (IQI)-based model that can predict whether cracks of a certain size can be detected, as well as a model that can provide appropriate conditions to optimize x-ray crack detection setup. Because this modeling software can predict minimum crack sizes that can be detected by a particular X-ray radiography testing setup, users can test various setups until the desired crack detection capabilities are achieved (predicted) by the modeling system. These flaw size parameter models use a set of measured inputs, including thickness sensitivity, detector modulation transfer function, detector signal response function, and other setup geometry parameters, to predict the minimum crack sizes detectable by the testing setup and X-ray angle limits for detecting such flaws. Current X-ray methods provide adequate control for detection of volumetric flaws but do not provide a high probability of detection (POD), and crack detection sensitivity cannot be verified for reliable detection. This results in reduced confidence in terms of crack detection. Given that these cracks, if undetected, can cause catastrophic failure in various systems (e.g., pressure vessels, etc.), verifying that X-ray radiography systems used for NDE can detect such cracks is of the utmost importance in many applications.

Additive manufacturing or 3-D printing is a rapidly growing field where solid, objects can be produced layer by layer. This technology will have a significant impact in many areas including industrial manufacturing, medical, architecture, aerospace, and automotive. The advantages of additive manufacturing are reduction in material costs due to near net shape part builds, minimal machining required, computer assisted builds for rapid prototyping, and mass production capability. Traditional thermal nondestructive evaluation (NDE) techniques typically use a stationary heat source such as flash or quartz lamp heating to induce a temperature rise. The defects such as cracks, delamination damage, or voids block the heat flow and therefore cause a change in the transient heat flow response. There are drawbacks to these methods.

NASA's System for In-situ Defect (e.g., porosity, fiber waviness) Detection in Composites During Cure consists of an ultrasonic portable automated C-Scan system with an attached ultrasonic contact probe. This scanner is placed inside of an insulated vessel that protects the temperature-sensitive components of the scanner. A liquid nitrogen cooling systems keeps the interior of the vessel below 38°C. A motorized X-Y raster scanner is mounted inside an unsealed cooling container made of porous insulation boards with a cantilever scanning arm protruding out of the cooling container through a slot. The cooling container that houses the X-Y raster scanner is periodically cooled using a liquid nitrogen (LN2) delivery system. Flexible bellows in the slot opening of the box minimize heat transfer between the box and the external autoclave environment. The box and scanning arm are located on a precision cast tool plate. A thin layer of ultrasonic couplant is placed between the transducer and the tool plate. The composite parts are vacuum bagged on the other side of the tool plate and inspected. The scanning system inside of the vessel is connected to the controller outside of the autoclave. The system can provide A-scan, B-scan, and C-scan images of the composite panel at multiple times during the cure process. The in-situ system provides higher resolution data to find, characterize, and track defects during cure better than other cure monitoring techniques. In addition, this system also shows the through-thickness location of any composite manufacturing defects during cure with real-time localization and tracking. This has been demonstrated for both intentionally introduced porosity (i.e., trapped during layup) as well processing induced porosity (e.g., resulting from uneven pressure distribution on a part). The technology can be used as a non-destructive evaluation system when making composite parts in in an oven or an autoclave, including thermosets, thermoplastics, composite laminates, high-temperature resins, and ceramics.

The in situ inspection technology for additive manufacturing combines different types of cameras strategically placed around the part to monitor its properties during construction. The IR cameras collect accurate temperature data to validate thermal math models, while the visual cameras obtain highly detailed data at the exact location of the laser to build accurate, as-built geometric models. Furthermore, certain adopted techniques (e.g., single to grouped pixels comparison to avoid bad/biased pixels) reduce false positive readings. NASA has developed and tested prototypes in both laser-sintered plastic and metal processes. The technology detected errors due to stray powder sparking and material layer lifts. Furthermore, the technology has the potential to detect anomalies in the property profile that are caused by errors due to stress, power density issues, incomplete melting, voids, incomplete fill, and layer lift-up. Three-dimensional models of the printed parts were reconstructed using only the collected data, which demonstrates the success and potential of the technology to provide a deeper understanding of the laser-metal interactions. By monitoring the print, layer by layer, in real-time, users can pause the process and make corrections to the build as needed, reducing material, energy, and time wasted in nonconforming parts.

The MXS produces electrons by shining UV light from an LED onto a photocathode material such as magnesium. The electrons are then accelerated across several kV and into a chosen target material; deceleration produces X-rays characteristic of the target. The MXS uses an electron multiplier for high X-ray production efficiency. The MXS is more compact, rugged, and power-efficient than standard X-ray sources. It can be manufactured using commercially available components and 3D printed housing, resulting in a low cost to manufacture. Unlike traditional X-ray sources, the MXS does not require a filament or vacuum and cooling systems. Most importantly, enabling rapid and arbitrary modulation allows using X-rays in the time domain, a new dimension to X-ray applications.